Adaptive unanimous voting (UV) scheme for distributed self-diagnosis

Author

Jae Young Lee ; Yong Youn, Hee ; Singh, Adit D.

Author_Institution

Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA

Volume

44

Issue

5

fYear

1995

fDate

5/1/1995 12:00:00 AM

Firstpage

730

Lastpage

735

Abstract

Distributed self-diagnosis approach proposed for multiprocessor systems is also effective for integrated circuit wafers containing a number of identical circuits. Here the testing of each node is based on the majority voting on the test results from itself and neighboring nodes. In this paper, we identify that the unanimous voting (UV) approach always outperforms the individual voting (IV) approach, irrespective of the number of voting cells and fault rate. Based on the UV approach, the optimal number of tests is obtained. We also introduce an adaptive voting scheme by which the test overhead of the traditional voting schemes can be significantly reduced

Keywords

fault tolerant computing; multiprocessing systems; adaptive unanimous voting; adaptive voting; distributed self-diagnosis; individual voting; integrated circuit wafers; majority voting; multiprocessor systems; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Distributed computing; Fault diagnosis; Integrated circuit testing; Multiprocessing systems; System testing; Voting;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.381964

Filename

381964