DocumentCode
772884
Title
Reduction of internal current measurements within the failure bounds analogue diagnosis scheme
Author
Garrett, C.
Author_Institution
Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
Volume
26
Issue
9
fYear
1990
fDate
4/26/1990 12:00:00 AM
Firstpage
583
Lastpage
584
Abstract
One method of automating diagnosis of failures in analogue circuits is called failure bounds. Unfortunately current measurements, internal to the UUT, are required to give resolution of failures to component level. Two methods of eliminating internal current measurement whilst maintaining good resolution are introduced.
Keywords
analogue circuits; electric current measurement; failure analysis; UUT; analogue circuits; component level; failure bounds analogue diagnosis scheme; internal current measurements; resolution;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900382
Filename
48768
Link To Document