DocumentCode :
774070
Title :
Recombination and loss mechanisms in low-threshold InAs-GaAs 1.3-μm quantum-dot lasers
Author :
Marko, Igor P. ; Adams, Alfred R. ; Sweeney, Stephen J. ; Mowbray, David J. ; Skolnick, Maurice S. ; Liu, Huiyan Y. ; Groom, Kristian M.
Author_Institution :
Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
Volume :
11
Issue :
5
fYear :
2005
Firstpage :
1041
Lastpage :
1047
Abstract :
We show that even in quantum-dot (QD) lasers with very low threshold current densities (Jth=40--50 A/cm2 at 300 K), the temperature sensitivity of the threshold current arises from nonradiative recombination that comprises ∼60% to 70% of Jth at 300 K, whereas the radiative part of Jth is almost temperature insensitive. The influence of the nonradiative recombination mechanism decreases with increasing hydrostatic pressure and increasing band gap, which leads to a decrease of the threshold current. We also studied, for the first time, the band gap dependence of the radiative part of Jth, which in contrast increases strongly with increasing band gap. These results suggest that Auger recombination is an important intrinsic recombination mechanism for 1.3-μm lasers, even in a very low threshold QD device, and that it is responsible for the temperature sensitivity of the threshold current.
Keywords :
Auger effect; III-V semiconductors; electron-hole recombination; energy gap; gallium arsenide; indium compounds; optical losses; quantum dot lasers; 1.3 mum; 300 K; Auger recombination; InAs-GaAs; InAs-GaAs lasers; band gap; hydrostatic pressure; loss mechanism; low-threshold lasers; nonradiative recombination; quantum-dot lasers; recombination mechanism; temperature sensitivity; threshold current densities; Land surface temperature; Laser theory; Photonic band gap; Quantum dot lasers; Quantum dots; Radiative recombination; Semiconductor lasers; Temperature distribution; Temperature sensors; Threshold current; Characteristic temperature; InAs; hydrostatic high pressure; quantum dot (QD); recombination mechanisms; semiconductor laser; threshold current;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2005.853847
Filename :
1564039
Link To Document :
بازگشت