DocumentCode :
774079
Title :
Device performance and wavelength tuning behavior of ultra-short quantum-cascade microlasers with deeply etched Bragg-mirrors
Author :
Höfling, Sven ; Reithmaier, Johann Peter ; Forchel, Alfred
Author_Institution :
Tech. Phys. & Microstruct. Lab., Univ. of Wurzburg, Germany
Volume :
11
Issue :
5
fYear :
2005
Firstpage :
1048
Lastpage :
1054
Abstract :
The fabrication and characteristics of edge-emitting quantum-cascade (QC) lasers and microlasers with monolithically integrated deeply etched semiconductor-air Bragg-mirrors based on GaAs is reported. We observe a reduction of the threshold current density by 25% and an increase of the operation temperature by 23 K to a maximum of 315 K for 800 μm long devices by employing Bragg-mirrors. Devices with ultra-short cavities of about 100 μm (∼40 times the wavelength) operate up to 260 K. At 80 K, these devices show threshold currents as low as 0.63 A and output levels up to 56 mW. In these devices, longitudinal single mode operation with output levels exceeding 7.7, 5.6, and 2.8 mW was measured at 180, 200, and 240 K, respectively. This can be attributed to the limited gain bandwidth of QC lasers and the large mode spacing in these devices. By temperature control the emission wavelength can be tuned without mode jumps over 80 nm. The feasibility to pre-select the emission wavelength by a direct control of the Fabry-Perot mode was demonstrated by microlasers with 1 μm cavity length difference.
Keywords :
III-V semiconductors; distributed Bragg reflector lasers; etching; gallium arsenide; integrated optoelectronics; laser mirrors; laser modes; laser tuning; microcavity lasers; monolithic integrated circuits; quantum cascade lasers; stimulated emission; temperature control; 0.63 A; 1 mum; 100 mum; 180 K; 2.8 mW; 200 K; 240 K; 260 K; 5.6 mW; 56 mW; 7.7 mW; 80 K; 800 mum; Fabry-Perot mode; current density; deeply etched Bragg-mirrors; device performance; distributed Bragg reflector laser; edge-emitting lasers; edge-emitting microlasers; gain bandwidth; longitudinal single mode operation; mode spacing; monolithic integration; quantum-cascade lasers; quantum-cascade microlasers; semiconductor-air Bragg-mirrors; ultrashort cavities; ultrashort microlasers; wavelength tuning; Bandwidth; Etching; Gallium arsenide; Laser tuning; Optical device fabrication; Quantum cascade lasers; Semiconductor lasers; Temperature; Threshold current; Wavelength measurement; Distributed-Bragg reflector (DBR); microlaser; mid-infrared; quantum-cascade (QC) laser; wavelength tuning;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2005.853849
Filename :
1564040
Link To Document :
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