• DocumentCode
    774302
  • Title

    Concurrent error detection in array multipliers by BIDO

  • Author

    Chen, T.-H. ; Lee, Y.-P. ; Chen, L.G.

  • Author_Institution
    Dept. of Electron. Eng., Naitai Coll., Tainan, Taiwan
  • Volume
    142
  • Issue
    6
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    430
  • Abstract
    Array multipliers consist of full adders (FAs). When the sums and carrys are propagated down through the array, each row of FAs is used only once. Most FAs are doing no useful work at any given time. The authors design a concurrent error-detectable array multiplier using bidirectional operation (BIDO). The BIDO implementation employs the inherent idle FAs in an array multiplier to perform the repeated operation. As a result, both normal and repeated operations are performed in one single set of hardware simultaneously. The experimental results show that the BIDO implementation has the following significant benefits: (i) It has a moderate hardware overhead, but little performance degradation and (ii) The time and hardware overheads are constant for detecting both single and multiple faults
  • Keywords
    adders; error detection; fault tolerant computing; multiplying circuits; array multipliers; bidirectional operation; carrys; concurrent error detection; concurrent error-detectable array multiplier; full adders; hardware overhead; performance degradation; sums;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2387
  • Type

    jour

  • DOI
    10.1049/ip-cdt:19952222
  • Filename
    487916