• DocumentCode
    775082
  • Title

    Robust design of rail-to-rail CMOS operational amplifiers for a low power supply voltage

  • Author

    Sakurai, Satoshi ; Ismail, Mohammed

  • Author_Institution
    Ohio State Univ., Columbus, OH, USA
  • Volume
    31
  • Issue
    2
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    146
  • Lastpage
    156
  • Abstract
    New bias circuits which provide currents to n- and p-channel differential pairs placed in parallel are introduced. The bias currents are a function of the input common mode voltage in such a way that the total transconductance, gmT, of the differential pairs is constant over the entire common mode range. The bias circuits, together with the differential pairs, are used to design input stages of low-voltage (⩽3.3 V) complementary metal-oxide-semiconductor (CMOS) operational amplifiers (op amps). The new circuits are robust in that they do not require transconductance parameter matching of n- and p-channel transistors for proper operation. A simple rail-to-rail common source output stage with class AB control is also developed and used in the design of two-stage op amps. Experimental results of MOSIS test chips containing a family of low-voltage op amps fabricated in 2 μm p-well process are provided. The results demonstrate the effectiveness and robustness of the proposed constant transconductance input stages in achieving constant opamp unity gain frequency with very low levels of total harmonic distortion (THD) and with 3.3 V and 2.5 V power supply voltage
  • Keywords
    CMOS analogue integrated circuits; integrated circuit design; operational amplifiers; 2 micron; 2.5 V; 3.3 V; CMOS operational amplifiers; MOSIS test chips; bias circuits; class AB control; common mode range; constant transconductance input stage; differential pairs; low-voltage opamps; n-channel transistors; p-channel transistors; rail-to-rail common source output stage; robust design; total harmonic distortion; two-stage op amps; unity gain frequency; Circuit testing; Differential amplifiers; Frequency; Operational amplifiers; Rail to rail amplifiers; Rail to rail operation; Rail to rail outputs; Robustness; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.487991
  • Filename
    487991