• DocumentCode
    775115
  • Title

    Design of SOI CMOS operational amplifiers for applications up to 300°C

  • Author

    Eggermont, J.-P. ; De Ceuster, Denis ; Flandre, Denis ; Gentinne, Bernard ; Jespers, Paul G A ; Colinge, Jean-Pierre

  • Author_Institution
    Microelectron. Lab., Univ. Catholique de Louvain, Belgium
  • Volume
    31
  • Issue
    2
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    179
  • Lastpage
    186
  • Abstract
    Design guidelines using two analog parameters (Early voltage and transconductance to drain current ratio) are proposed for correct operation of silicon-on-insulator (SOI) CMOS operational amplifiers (opamp) at elevated temperature up to 300°C. The dependence of these parameters on temperature is first described. A new single-stage CMOS opamp model using only these two parameters is presented and compared to measurements of several implementations operating up to 300°C for applications such as micropower (below 4 μW at 1.2 V supply voltage), high gain (65 dB) or high frequency up to 100 MHz. Trade-offs among such factors as gain, bandwidth, phase margin, signal swing, noise, matching, slew rate and power consumption are described. The extension to other architectures is suggested and the design methodology is valid for bulk as well as SOI CMOS opamps
  • Keywords
    CMOS analogue integrated circuits; integrated circuit design; linear network synthesis; operational amplifiers; silicon-on-insulator; 1.2 V; 100 MHz; 300 C; 4 muW; 65 dB; Early voltage; SOI CMOS op amps; Si; bandwidth; design guidelines; elevated temperature; gain; high temperature operation; matching; noise; operational amplifiers; phase margin; power consumption; signal swing; single-stage CMOS opamp model; slew rate; transconductance to drain current ratio; Bandwidth; Frequency measurement; Gain measurement; Guidelines; Operational amplifiers; Semiconductor device modeling; Silicon on insulator technology; Temperature dependence; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.487994
  • Filename
    487994