• DocumentCode
    775285
  • Title

    Nonlinear FDTD analysis and experimental verification of four-wave mixing in InGaAsP-InP racetrack microresonators

  • Author

    Fujii, Masafumi ; Koos, Christian ; Poulton, Christopher ; Leuthold, Juerg ; Freude, Wolfgang

  • Author_Institution
    Inst. of High-Frequency & Quantum Electron., Univ. of Karlsruhe, Germany
  • Volume
    18
  • Issue
    2
  • fYear
    2006
  • Firstpage
    361
  • Lastpage
    363
  • Abstract
    We demonstrate for the first time a nonlinear finite-difference time-domain (FDTD) analysis of optical parametric four-wave mixing (FWM) in an actual InGaAsP-InP-based racetrack microresonator, and the results are compared with measurements on an experimental prototype. It has been found from the two-dimensional (2-D) and three-dimensional FDTD analyses that the resonance frequencies can be reasonably predicted by an FDTD model by considering the strong material dispersion of the waveguide medium and that the wavelength conversion by FWM is not sensitive to the dimensionality of the model; thus, it is efficiently predicted by the 2-D FDTD model.
  • Keywords
    III-V semiconductors; finite difference time-domain analysis; gallium arsenide; gallium compounds; indium compounds; micro-optics; microcavities; multiwave mixing; optical dispersion; optical resonators; optical waveguide theory; InGaAsP-InP; InGaAsP-InP racetrack microresonators; finite-difference time-domain analysis; four-wave mixing; material dispersion; nonlinear FDTD analysis; resonance frequencies; waveguide medium; wavelength conversion; Finite difference methods; Four-wave mixing; Microcavities; Nonlinear optics; Optical mixing; Optical sensors; Optical wavelength conversion; Predictive models; Time domain analysis; Two dimensional displays; Finite-difference time-domain (FDTD); four-wave mixing (FWM); integrated optics; microresonator; microwave; nonlinear optics; roughness; waveguides; wavelet;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2005.861955
  • Filename
    1564155