DocumentCode :
777062
Title :
Visible emission contours for neon plasmas in silicon microcavity discharge devices: pressure dependence of spatially resolved fluorescence above the anode plane
Author :
Ostrom, Nels P. ; Eden, J. Gary
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Volume :
33
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
576
Lastpage :
577
Abstract :
Images of the Ne plasma plume residing above the microcavity of a Si inverted square pyramid microdischarge device have been obtained with an optical telescope and a charged-coupled device camera. Viewing the discharge along the device surface show the plume to be approximately hemispherical with a bright core having a width (at the surface) of ∼140 μm for pNe=300 torr. The dependence of the plume contour on pressure is in qualitative agreement with recent computational results (Kushner, 2004).
Keywords :
discharges (electric); neon; plasma diagnostics; plasma pressure; 300 torr; Ne; Ne plasma plume; Si inverted square pyramid microdischarge device; anode plane; charged-coupled device camera; device surface; neon plasmas; optical telescope; silicon microcavity discharge devices; spatially resolved fluorescence; visible emission contours; Anodes; Fluorescence; Microcavities; Optical devices; Plasma devices; Silicon; Spatial resolution; Stimulated emission; Surface discharges; Telescopes; Fluorescence; microcavity plasma; microdischarge;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2005.845289
Filename :
1420584
Link To Document :
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