• DocumentCode
    777459
  • Title

    Wavelets and the study of the distant Universe

  • Author

    Bijaoui, Albert ; Slezak, Eric ; Rué, Frédéric ; Lega, Elena

  • Author_Institution
    CNRS, Nice, France
  • Volume
    84
  • Issue
    4
  • fYear
    1996
  • fDate
    4/1/1996 12:00:00 AM
  • Firstpage
    670
  • Lastpage
    679
  • Abstract
    The large-scale distribution of galaxies in the Universe exhibits structures at various scales, these so-called groups, clusters, and superclusters of galaxies being more or less hierarchically organized. A specific vision model is needed in order to detect, describe, and classify each component of this hierarchy. To do so, we have developed a multiscale vision model based on an unfolding into a scale space allowing us to detect structures of different sizes. A discrete wavelet transform is done by the a trous algorithm. The algorithm is implemented for astronomical images and also for lists of object positions, currently called catalogues in astronomical literature. Some applications on astrophysical data of cosmological interest are briefly described: (1) inventory procedures for galaxy counts on wide-field images, (2) processing of X-ray cluster images lending to the analyses of the total matter distribution, and (3) detection of large-scale structures from galaxy counts, From the analyses of N-body simulations we show that the vision model from the wavelet transform provides a new statistical indicator on cosmological scenarios
  • Keywords
    astronomical techniques; astronomy computing; clusters of galaxies; cosmology; galaxies; image processing; transforms; wavelet transforms; N-body simulations; X-ray cluster imaging; a trous algorithm; astronomical images; catalogues; discrete wavelet transform; distant Universe; galaxy counts; large-scale distribution; large-scale structure; scale space; superclusters; total matter distribution; vision model; wide-field images; Analytical models; Clustering algorithms; Discrete wavelet transforms; Image analysis; Large-scale systems; Wavelet analysis; Wavelet transforms; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.488706
  • Filename
    488706