DocumentCode
77746
Title
A Stochastic Approach for the Analysis of Fault Trees With Priority AND Gates
Author
Peican Zhu ; Jie Han ; Leibo Liu ; Zuo, Ming J.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
Volume
63
Issue
2
fYear
2014
fDate
Jun-14
Firstpage
480
Lastpage
494
Abstract
Dynamic fault tree (DFT) analysis has been used to account for dynamic behaviors such as the sequence-dependent, functional-dependent, and priority relationships among the failures of basic events. Various methodologies have been developed to analyze a DFT; however, most methods require a complex analytical procedure or a significant simulation time for an accurate analysis. In this paper, a stochastic computational approach is proposed for an efficient analysis of the top event´s failure probability in a DFT with priority AND (PAND) gates. A stochastic model is initially proposed for a two-input PAND gate, and a successive cascading model is then presented for a general multiple-input PAND gate. A stochastic approach using the proposed models provides an efficient analysis of a DFT compared to an accurate analysis or algebraic approach. The accuracy of a stochastic analysis increases with the length of random binary bit streams in stochastic computation. The use of non-Bernoulli sequences of random permutations of fixed counts of 1s and 0s as initial input events´ probabilities makes the stochastic approach more efficient, and more accurate than Monte Carlo simulation. Non-exponential failure distributions and repeated events are readily handled by the stochastic approach. The accuracy, efficiency, and scalability of the stochastic approach are shown by several case studies of DFT analysis.
Keywords
circuit reliability; fault trees; logic gates; stochastic processes; dynamic fault tree analysis; general multiple input PAND gate; nonBernoulli sequence; nonexponential failure distributions; priority AND gates; random permutation; stochastic computation; Analytical models; Computational modeling; Discrete Fourier transforms; Fault trees; Logic gates; Probability density function; Stochastic processes; Dynamic fault tree; non-Bernoulli sequence; priority AND gate; reliability analysis; stochastic computation; stochastic logic;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2014.2313796
Filename
6797971
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