Title :
A 32-channel charge readout IC for programmable, nonlinear quantization of multichannel detector data
Author :
Garverick, Steven L. ; Skrenes, Lany ; Baertsch, Richard D.
Author_Institution :
Dept. of Electr. Eng. & Appl. Phys., Case Western Reserve Univ., Cleveland, OH, USA
fDate :
5/1/1995 12:00:00 AM
Abstract :
A Charge Readout Integrated Circuit (CRIC) which converts detector charges to digital codes is described. The CRIC provides 32 channels of circuitry needed to form charge-to-digital converters having a total dynamic range of 17 b comprised of 4 b of pre-amp gain control and a conversion range of 13 b. Each channel includes a switched-capacitor integrator, a double-sampling amplifier, a sampling comparator, and a 12-b digital latch, forming a pipeline from which a new conversion result is readout every 50 μs. The data conversion scheme implements a programmable compression curve, which is stored as a lookup table in an off-chip, digital memory. In addition to the lookup table, data conversion requires an off-chip digital-to-analog converter, both of which may be shared by any number of CRIC´s. The CRIC was fabricated using a 3-μm, n-well BiCMOS process, and occupies a die area of 5.1 mm×7.5 mm. It operates at 10 MHz, consumes 440 mW from ±5-V supplies, and has a demonstrated input-referred noise performance of 2.2 μV r.m.s., i.e., 1400 e- on 100 pF of shunt capacitance
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; digital readout; integrated circuit noise; mixed analogue-digital integrated circuits; sensors; signal processing equipment; table lookup; -5 V; 10 MHz; 17 bit; 3 micron; 32-channel configuration; 440 mW; 5 V; 50 mus; charge readout IC; charge-to-digital converters; data conversion scheme; detector charge conversion; digital codes; digital latch; double-sampling amplifier; lookup table; multichannel detector data; n-well BiCMOS process; pre-amp gain control; programmable compression curve; programmable nonlinear quantization; sampling comparator; switched-capacitor integrator; Data conversion; Detectors; Digital integrated circuits; Digital-analog conversion; Dynamic range; Gain control; Latches; Pipelines; Sampling methods; Table lookup;
Journal_Title :
Solid-State Circuits, IEEE Journal of