Title :
An efficient TSC 1-out-of-3 code checker
Author :
Paschalis, A.M. ; Efstathiou, C. ; Halatsis, C.
Author_Institution :
Inst. of Inf. & Telecommun., NRCPS Democritos, Attiki, Greece
fDate :
3/1/1990 12:00:00 AM
Abstract :
A design method for a combinational totally self-checking (TSC) 1-out-of-3 code checker is presented. This method is not only simpler and more efficient than others, but is also successful in the case where more than one 1-out-of-3 code exists in a TSC system
Keywords :
automatic testing; integrated logic circuits; logic design; logic testing; TSC 1-out-of-3 code checker; combinational totally self-checking; Built-in self-test; Circuit faults; Design methodology; Electrical fault detection; Face detection; Fault detection; Fault tolerance; Informatics; MOSFETs; Telecommunications;
Journal_Title :
Computers, IEEE Transactions on
