• DocumentCode
    77804
  • Title

    Early Detection of Collaboration Conflicts and Risks

  • Author

    Brun, Yuriy ; Holmes, Reid ; Ernst, Michael D. ; Notkin, David

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Massachusetts, Amherst, MA, USA
  • Volume
    39
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    1358
  • Lastpage
    1375
  • Abstract
    Conflicts among developers´ inconsistent copies of a shared project arise in collaborative development and can slow progress and decrease quality. Identifying and resolving such conflicts early can help. Identifying situations which may lead to conflicts can prevent some conflicts altogether. By studying nine open-source systems totaling 3.4 million lines of code, we establish that conflicts are frequent, persistent, and appear not only as overlapping textual edits but also as subsequent build and test failures. Motivated by this finding, we develop a speculative analysis technique that uses previously unexploited information from version control operations to precisely diagnose important classes of conflicts. Then, we design and implement Crystal, a publicly available tool that helps developers identify, manage, and prevent conflicts. Crystal uses speculative analysis to make concrete advice unobtrusively available to developers.
  • Keywords
    configuration management; groupware; program diagnostics; public domain software; software engineering; Crystal; collaboration conflicts; collaborative development; open-source systems; overlapping textual edits; publicly available tool; source code; speculative analysis technique; subsequent build-and-test failures; version control operations; Collaboration; Computer science; Control systems; Crystals; History; Open source software; Terminology; Collaborative development; Crystal; collaboration conflicts; developer awareness; speculative analysis; version control;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/TSE.2013.28
  • Filename
    6520859