DocumentCode
778619
Title
The mathematics of success and failure (SPC)
Author
Rose, Kenneth
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
Volume
7
Issue
6
fYear
1991
Firstpage
26
Lastpage
30
Abstract
The use of statistical process control (SPC) to improve quality is discussed. Mathematical tools and techniques for SPC are reviewed. How to decide when a change in an indicator is statistically significant is addressed. An approach to SPC in which one attempts to reduce process sensitivity to external variations rather than control these variations more tightly is discussed.<>
Keywords
quality control; statistical process control; QC; SPC; external variations; process sensitivity; product quality improvement; statistical process control; Automobiles; Contamination; Costs; Integrated circuit manufacture; Integrated circuit technology; Manufacturing processes; Mathematics; Microelectronics; Process control; Warranties;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/101.101753
Filename
101753
Link To Document