Title :
Analysis of step-stress accelerated-life-test data: a new approach
Author :
Tang, L.C. ; Sun, Y.S. ; Goh, T.N. ; Ong, H.L.
Author_Institution :
Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore
fDate :
3/1/1996 12:00:00 AM
Abstract :
A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the maximum likelihood estimator (MLE) of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution
Keywords :
Weibull distribution; failure analysis; life testing; maximum likelihood estimation; reliability theory; 2-parameter Weibull distribution; 3-parameter Weibull distribution; Nelson cumulative exposure model; data analysis; estimation procedure; failure-free life; linear cumulative exposure model; location parameter; maximum likelihood estimator; multiple censoring; step-stress accelerated-life-test data; stress-dependent distribution parameters; Acceleration; Data analysis; Failure analysis; Life estimation; Life testing; Maximum likelihood estimation; Silicon; Stress; Sun; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
