• DocumentCode
    77895
  • Title

    Speckle Pattern Errors in Self-Mixing Interferometry

  • Author

    Donati, Silvano ; Martini, Giuseppe ; Tambosso, Tiziana

  • Author_Institution
    Dept. of Ind. & Inf. Eng., Univ. of Pavia, Pavia, Italy
  • Volume
    49
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    798
  • Lastpage
    806
  • Abstract
    We analyze the random errors occurring in interferometric measurements because of the speckle pattern regime, when the remote target is a diffusing surface. First, we review the statistical properties of speckle and discuss amplitude fading that is affecting the self-mixing interferometer (SMI) signal and methods to alleviate it. Second, we derive intra-speckle phase errors using the bivariate conditional probability, and find that the noise-equivalent-displacement for small displacement Δ is proportional to the ratio of Δ to speckle longitudinal size sl. Last, we extend the analysis to inter-speckle displacements (Δ > s1) and, after deriving speckle systematic and random errors, show that operation up to meters on a diffusing surface target is possible with a small (≈ λ) error. Results are mainly focussed on SMI, yet they have general validity for any configuration of interferometry.
  • Keywords
    displacement measurement; light interferometry; measurement by laser beam; probability; speckle; vibration measurement; SMI; amplitude fading; bivariate conditional probability; diffusing surface target; interferometric measurements; intraspeckle phase errors; noise equivalent displacement; random errors; remote target; self-mixing interferometry; speckle pattern errors; speckle pattern regime; Coherence; Correlation; Displacement measurement; Fading; Measurement by laser beam; Optical interferometry; Speckle; Interferometry; optical feedback lasers; speckle pattern; vibration and displacement measurements;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2013.2276894
  • Filename
    6576813