On random testing for combinational circuits with a high measure of confidence

One of the most important problems in random testing is the measurement of test confidence after a sequence of test vectors has been applied. Sequential statistical analysis is employed to determine the random test confidence. According to the analysis, the random test confidence depends on the detection probability of the circuit under test, the random test length, and the manufacturing yield. A detection procedure driven by a test quality indicator without presumed random test length is proposed based on the results of the sequential statistical analysis. Performance evaluation and simulation results demonstrate that the sequential statistical analysis reflects a better random test confidence than conventional approaches. This difference is due to the fact that conventional test confidence measures do not take the manufacturing yield into account