• DocumentCode
    780132
  • Title

    Modeling and simulation of core switching noise for ASICs

  • Author

    Na, Nanju ; Choi, Jinwoo ; Swaminathan, Madhavan ; Libous, James P. ; O´Connor, Daniel P.

  • Author_Institution
    Agilent Technol., San Jose, CA, USA
  • Volume
    25
  • Issue
    1
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    11
  • Abstract
    This paper presents simulation and analysis of core switching noise for a CMOS ASIC test vehicle. The test vehicle consists of a ceramic ball grid array (CBGA) package on a printed circuit board (PCB). The entire test vehicle has been modeled by accounting for all the plane resonances using the cavity resonator method. The models included both the on-chip and off-chip decoupling capacitors. Using both time domain and frequency domain simulations, the role of plane resonances on power supply noise for fast current edge rates has been discussed. The models have been constructed to amplify certain parts of the test vehicle during simulations
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; ball grid arrays; capacitors; ceramic packaging; circuit resonance; circuit simulation; frequency-domain analysis; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; power supply circuits; time-domain analysis; ASIC; CBGA; CMOS ASIC test vehicle; PCB; cavity resonator method; ceramic ball grid array package; core switching noise; current edge rates; frequency domain simulations; modeling; off-chip decoupling capacitors; on-chip decoupling capacitors; plane resonances; power supply noise; printed circuit board; simulation; time domain simulations; Analytical models; Application specific integrated circuits; Ceramics; Circuit noise; Circuit simulation; Circuit testing; Electronics packaging; Resonance; Semiconductor device modeling; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2002.1017678
  • Filename
    1017678