DocumentCode
780333
Title
Reducing power dissipation in CMOS circuits by signal probability based transistor reordering
Author
Hossain, Razak ; Zheng, Menghui ; Albicki, Alexander
Author_Institution
Mentor Graphics Corp., Warren, NJ, USA
Volume
15
Issue
3
fYear
1996
fDate
3/1/1996 12:00:00 AM
Firstpage
361
Lastpage
368
Abstract
This paper introduces novel transistor reordering schemes to reduce the expected or average dynamic power dissipation in CMOS circuits. The transistor reordering is based on the signal probability values at the inputs of the gates. The paper begins with a simple analytical model for the dynamic power dissipation in a static NAND gate. The model is used to derive an algorithm for transistor reordering which reduces dynamic power dissipation. A simulation technique for accurately measuring the power dissipation in NAND gates is also presented, along with the results of the reordering algorithm. A transistor reordering algorithm for CMOS complex gates is subsequently presented. Transistor reordering is found to be an effective way to reduce power dissipation in all of these circuits, with the reduction in dynamic power dissipation compared to the worst case configuration, being as high as 50% in some instances. The limited overhead associated with transistor reordering encourage its application as a low power design technique
Keywords
CMOS logic circuits; circuit analysis computing; circuit layout CAD; integrated circuit layout; integrated circuit modelling; logic CAD; logic gates; probability; CMOS circuits; CMOS complex gates; analytical model; low power design technique; power dissipation reduction; signal probability based reordering; simulation technique; static NAND gate; transistor reordering algorithm; Analytical models; Capacitance; Circuit simulation; FETs; MOS devices; MOSFET circuits; Power MOSFET; Power dissipation; Power measurement; Semiconductor device modeling;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.489107
Filename
489107
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