Title :
Aperture jitter in BPSK systems
Author_Institution :
Sch. of Surveying & Spatial Inf. Syst., Univ. of New South Wales, Sydney, NSW, Australia
fDate :
3/17/2005 12:00:00 AM
Abstract :
Aperture jitter effects in sampled systems have usually been modelled as additive noise, based on a sinusoidal input signal. However, in BPSK systems, large errors can occur if the jittered sample crosses a data bit boundary. This case is analysed here and found to be significant for cases of small jitter variance.
Keywords :
jitter; phase shift keying; signal sampling; BPSK systems; additive noise; aperture jitter effects; data bit boundary; jitter variance; sampled systems; sinusoidal input signal;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20057416
