• DocumentCode
    780587
  • Title

    Identification of Wiener-Hammerstein models using linear interpolation in the frequency domain (LIFRED)

  • Author

    Tan, Ai Hui ; Godfrey, Keith

  • Author_Institution
    Div. of Electr. & Electron. Eng., Warwick Univ., Coventry, UK
  • Volume
    51
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    509
  • Lastpage
    521
  • Abstract
    A new method to identify the linear subsystems of a Wiener-Hammerstein model through the measurement of the second-order Volterra kernel is proposed. This technique makes use of the symmetry properties of the Volterra kernel and assumes that the frequency response gain and phase between estimated points can be reasonably well approximated by a straight line. The signal applied for the identification is a multisine with properties of no interharmonic distortion. Several advantages of the proposed method over existing ones are discussed, and two simulation examples are presented to illustrate the applicability of the technique. The method is also shown to be robust to noise and distortion in the input signal
  • Keywords
    frequency response; frequency-domain analysis; identification; interpolation; linear systems; nonlinear systems; transfer functions; Wiener-Hammerstein model; frequency domain identification; frequency response gain; linear interpolation; linear subsystems; second-order Volterra kernel; Distortion; Frequency domain analysis; Frequency estimation; Frequency measurement; Interpolation; Kernel; Linear systems; Noise robustness; Nonlinear systems; Signal processing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.1017722
  • Filename
    1017722