• DocumentCode
    780649
  • Title

    Characterization and qualification of a neutron irradiation environment for neutron hardness assurance testing of electronic devices

  • Author

    Bennion, J.S. ; Sandquist, G.M. ; Kelly, J.G. ; Griffin, P.J. ; Sheehan, P.S. ; Saxey, B.L.

  • Author_Institution
    Coll. of Eng., Idaho State Univ., Pocatello, ID, USA
  • Volume
    42
  • Issue
    6
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    1886
  • Lastpage
    1894
  • Abstract
    Diagnostic experiments have been performed to characterize and validate a neutron irradiation environment for use as a calibrated neutron source for neutron hardness assurance testing. Facility qualification for a TRIGA nuclear reactor was achieved by comparing the neutron-induced displacement damage in divided-lots of Si-based electronic components irradiated to the same 1-MeV equivalent fluence at the candidate environment and at a qualified fast burst reactor facility
  • Keywords
    neutron effects; neutron sources; radiation hardening (electronics); semiconductor device testing; 1 MeV; Si; TRIGA nuclear reactor; calibrated neutron source; displacement damage; electronic devices; facility qualification; fast burst reactor; neutron hardness assurance testing; neutron irradiation; Aluminum; Contracts; Electronic components; Electronic equipment testing; Fuels; Inductors; Laboratories; Neutrons; Nuclear electronics; Qualifications;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.489231
  • Filename
    489231