DocumentCode :
780691
Title :
Analytic approximation for charge current and deposition by 0.1 to 100 MeV electrons in thick slabs
Author :
Frederickson, A.R. ; Bell, J.T. ; Beidl, E.A.
Author_Institution :
USAF Phillips Lab, Hanscom AFB, MA, USA
Volume :
42
Issue :
6
fYear :
1995
Firstpage :
1910
Lastpage :
1921
Abstract :
An analytic function is developed for approximation of current penetration and charge deposition as a function of depth with normal incidence high energy electrons on slabs. The slabs must be thicker than the electron penetration depth and be composed of one material. Six adjustable parameters are evaluated to fit the function to tabulated ITS monte carlo and experimental electron deposition data. The results were developed from data spanning the entire energy range in C, Al, Cu, Ag, and Au, but are assumed to apply to all atomic number materials at all energies in the range.
Keywords :
Algorithm design and analysis; Conducting materials; Conductivity; Electric breakdown; Electron beams; Indium tin oxide; Insulation; MOSFETs; Monte Carlo methods; Slabs;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1995.489235
Filename :
489235
Link To Document :
بازگشت