Title :
Invited Paper-Research with AVF Cyclotrons in the USA
Author_Institution :
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Keywords :
Cyclotrons; Nuclear measurements; Optical polarization; Optical scattering; Optical sensors; Particle scattering; Projectiles; Protons; Shape measurement; Special issues and sections;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1966.4324236
