DocumentCode
781897
Title
Effects of Parasitic Components in High-FrequencyResonant Drivers for SynchronousRectification MOSFETs
Author
Spiazzi, Giorgio ; Mattavelli, Paolo ; Rossetto, Leopoldo
Author_Institution
Dept. of Inf. Eng., Univ. of Padova, Padova
Volume
23
Issue
4
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
2082
Lastpage
2092
Abstract
Resonant drivers are usually employed for driving synchronous rectifier (SR) metal oxide semiconductor field effect transistors in high-frequency applications mainly because of their ability to supply high total gate charge in a very short time, while maintaining a high efficiency. However, their practical performance are strongly affected by parasitic components, whose effect is enhanced in applications requiring very high switching frequencies. In this paper, the effects of parasitic components in three different nonisolated resonant driver topologies are analyzed by considering their impact on the driver losses and on the SR gate voltage. The analyses and the experimental verifications reported in this paper originally show that, due to the internal parasitic inductance as well as the parasitic output capacitance of the driver switches, some driver topologies, in principle promising optimum performance, are not always the best solution for very high frequency applications. The more performing resonant driver, was also tested on the voltage regulator module working at 1.8 MHz reported in [21].
Keywords
MOSFET; driver circuits; rectifiers; frequency 1.8 MHz; high-frequency resonant drivers; metal oxide semiconductor field effect transistors; parasitic components; synchronous rectification MOSFET; Driver circuits; FETs; MOSFETs; Performance analysis; Rectifiers; Resonance; Strontium; Switching frequency; Topology; Voltage; Synchronous rectifier (SR); voltage regulators modules (VRMs);
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2008.925200
Filename
4558258
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