• DocumentCode
    783168
  • Title

    Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

  • Author

    Niewczas, Pawel ; Dziuda, Lukasz ; Fusiek, Grzegorz ; Willshire, Andrew J. ; Mcdonald, James R ; Thursby, Graham ; Harvey, Dave ; Michie, W. Craig

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
  • Volume
    52
  • Issue
    4
  • fYear
    2003
  • Firstpage
    1092
  • Lastpage
    1096
  • Abstract
    In this paper, we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.
  • Keywords
    Fabry-Perot interferometers; arrayed waveguide gratings; optical sensors; strain sensors; 16-channel AWG device; AWG channels; arrayed waveguide grating devices; broadband light source; coarse spectrometer; curve fitting; extrinsic Fabry-Perot interferometric sensors; measurement quantity; measurement system; optical fiber; reflecting mode; solid state interrogation system; strain sensors; Arrayed waveguide gratings; Fabry-Perot; Light sources; Optical fibers; Optical interferometry; Optical waveguides; Sensor arrays; Sensor systems; Solid state circuits; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.814828
  • Filename
    1232351