• DocumentCode
    783530
  • Title

    Wideband communication system sensitivity to overloading quantization noise [ADC characterization]

  • Author

    Moschitta, Antonio ; Petri, Dario

  • Author_Institution
    Dipt. di Ingegneria Elettronica e dell´´Informazione, Univ. degli Studi di Perugia, Italy
  • Volume
    52
  • Issue
    4
  • fYear
    2003
  • Firstpage
    1302
  • Lastpage
    1307
  • Abstract
    The performance of analog-to-digital converters (ADCs) is usually characterized in their granular region, by adopting amplitude-limited sine-wave testing signals. However, some applications, like digital telecommunication systems, often require the conversion of signals which noticeably differ from sine-waves and which may introduce ADC overloading phenomena. In this paper, the uniform A/D conversion of Gaussian signals is investigated, assuming both memoryless and sigma-delta (Σ-Δ) converters. Then, the effects of quantization noise upon the behavior of a digital communication system (DCS) are considered. By extending previously published results, a model is introduced, which describes the bit error rate performance of an orthogonal frequency division multiplexing system also in the presence of overloading quantization noise, both for memoryless and Σ-Δ A/D uniform converters. Such a model allows a relation of the ADC requirements to the DCS ones.
  • Keywords
    Gaussian distribution; OFDM modulation; analogue-digital conversion; broadband networks; digital communication; error statistics; Σ-Δ converters; ADC characterization; ADC granular region; ADC overloading; DCS; DDM; Gaussian signal uniform A/D conversion; OFDM; analog-to-digital converters; bit error rate; digital telecommunication systems; direct digital modulation; memoryless converters; orthogonal frequency division multiplexing system; overloading quantization noise system sensitivity; sigma-delta converters; wideband communication systems; Analog-digital conversion; Bit error rate; Digital modulation; Distributed control; Distributed decision making; Noise level; OFDM; Quantization; Testing; Wideband;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.816855
  • Filename
    1232385