• DocumentCode
    784249
  • Title

    In-Line Plasma-Chemical Etching of Crystalline Silicon Solar Wafers at Atmospheric Pressure

  • Author

    Linaschke, Dorit ; Leistner, Matthias ; Grabau, Patrick ; Mäder, Gerrit ; Grählert, Wulf ; Dani, Ines ; Kaskel, Stefan ; Beyer, Eckhard

  • Author_Institution
    Dept. of CVD Thin Film Technol., Fraunhofer Inst. for Mater. & Beam Technol., Dresden
  • Volume
    37
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    979
  • Lastpage
    984
  • Abstract
    Atmospheric pressure plasma technologies are a potential substitution for wet chemical and vacuum processes in the production of crystalline silicon solar cells, leading to a simplified in-line processing chain. In this contribution, a plasma chemical etching technology is presented as a basic step for a future continuous production process. A linearly extended DC arc discharge is used for activation of the etching gases. An Ar-N2 mixture is fed through the plasma source; etch gases are injected into the afterglow plasma, near the substrate. Controlled purge gas systems prevent the contamination of the reaction zone with air or moisture as well as the release of reaction products. The plasma source was studied by a noninvasive in-line monitoring of the DC arc phenomena. Silicon etching rates can be controlled by the etch gas composition and the plasma conditions. Fourier Transform infrared spectroscopy of the waste gas was applied to monitor the current etching rates. First industrial tests confirmed standard efficiencies of the cells after edge isolation by atmospheric pressure plasma etching.
  • Keywords
    arcs (electric); argon; etching; nitrogen; plasma materials processing; semiconductor technology; silicon; solar cells; Ar-N2; Fourier transform infrared spectroscopy; Si; afterglow plasma; atmospheric pressure plasma etching; crystalline silicon solar cell production; crystalline silicon solar wafer; etch gas composition; etching gas activation; extended DC arc discharge; in line plasma chemical etching; in line processing chain; plasma conditions; plasma source; Atmospheric pressure; DC arc plasma source; gas phase spectroscopy; plasma chemical etching;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2016425
  • Filename
    4895295