Jitter testing technique and results at VC-4 desynchronizer output of SDH equipment

Author

Bregni, Stefano ; Agrosa, Maria D. ; Valtriani, Luca

Author_Institution

CEFRIEL, Milano, Italy

Volume

44

Issue

3

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

675

Lastpage

678

Abstract

Specifications relative to jitter and wander generation, at the output of desynchronizer systems, represent one of the hottest topics in characterizing SDH equipment. Among the many factors involved, pointer adjustments, due to phase deviations between the received timing signal and the SDH equipment internal clock, play indeed a primary role in phase noise accumulation. This paper deals with two different kinds of test designed for measuring-from 0 Hz on-phase transients due to AU pointer adjustments, namely: static and dynamic jitter measurement configuration. Moreover, results obtained by applying this technique to different suppliers´ equipment are herein presented

Keywords

dynamic testing; electric noise measurement; electric variables measurement; jitter; phase noise; synchronous digital hierarchy; telecommunication equipment testing; test equipment; SDH equipment; VC-4 desynchronizer output; desynchronizer; dynamic jitter measurement; internal clock; jitter testing; phase deviations; phase noise; phase transients; pointer adjustments; received timing signal; static jitter measurement; Clocks; Containers; Jitter; Measurement techniques; Phase locked loops; Synchronization; Synchronous digital hierarchy; Testing; Timing; Virtual colonoscopy;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.387306

Filename

387306