DocumentCode
785066
Title
Injection of Charge from Surface Traps into Films with Deep Bulk Traps
Author
Moreno, R.A. ; de Figueiredo, M.T. ; Ferreira, G.F.Leal
Author_Institution
Instituto de FÃ\xadsica e QuÃ\xadmica de Sáo Carlos Universidade de Sáo Paulo Sáo Carlos-SP-Brasil
Issue
3
fYear
1986
fDate
6/1/1986 12:00:00 AM
Firstpage
319
Lastpage
321
Abstract
In many cases the profile of an open circuit TSC in Teflon ® FEP shows two well defined peaks. The first is usually interpreted as due to charge injection from thermally activated surface traps into bulk traps and the second one, occurring at higher temperatures, as charge emission from these volume traps. Extending a calculation done by Kanazawa and Batra [1] a theoretical analysis for the first peak is carried out relating the surface voltage and the total charge in the sample as a function of two parameters: the initial Schubweg and the fraction of charge injected into the sample. The heat pulse technique, giving both the surface potential and the charge in the sample is suitable to verify the theory experimentally.
Keywords
Capacitance measurement; Circuits; Corona; Current measurement; Electrodes; Heating; Poisson equations; Surface discharges; Temperature; Voltage;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1986.349069
Filename
4156982
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