• DocumentCode
    785565
  • Title

    Integral Equations for Electrostatics Problems with Thin Dielectric or Conducting Layers

  • Author

    Olsen, R.G.

  • Author_Institution
    Electrical and Computer Engineering Department WAshington State University Pullman, WA
  • Issue
    4
  • fYear
    1986
  • Firstpage
    565
  • Lastpage
    573
  • Abstract
    Integral equations for the electric charge on continuous, arbitrarily thin, dielectric or conducting layers in axially symmetric geometries have been derived. When discretized, these equations become Boundary Element Method (BEM) equations for the charge. While the only boundary conditions enforced are continuity of potential and normal electrical displacement, the result is shown to be consistent with the boundary conditions used in the Charge Simulation Method (CSM) and the Finite Element Method (FEM) formulations of the problem. The method has the advantages over CSM that it requires only half the number of unknowns and it can be used to model the fields near the thin layer without using large numbers of unknowns. It has the advantage over FEM that only the thin layer surface need be discretized rather than the entire volume.
  • Keywords
    Boundary conditions; Boundary element methods; Coatings; Computational geometry; Dielectrics and electrical insulation; Electric potential; Electrostatics; Finite element methods; Integral equations; Surface treatment;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1986.348960
  • Filename
    4157031