• DocumentCode
    785654
  • Title

    Addition to "ADC testing"

  • Author

    Linnenbrink, T.E. ; Blair, J. ; Rapuano, S. ; Daponte, P. ; Balestrieri, E. ; Vito, L. De ; Max, S. ; Tilden, S.J.

  • Volume
    9
  • Issue
    5
  • fYear
    2006
  • Firstpage
    46
  • Lastpage
    46
  • Abstract
    In the April 2006 issue of IEEE Instrumentation and Measurement Magazine, "ADC Testing," the seventh in a series of tutorials on instrumentation and measurements, was presented. The authors have created a table that summarizes the parameters that are extracted from each ADC test setup that was presented in the tutorial. It is an easy reference guide for readers to find the topic they are researching
  • Keywords
    analogue-digital conversion; electronic equipment testing; ADC test setup; ADC testing; Apertures; Bandwidth; Feedback loop; Instrumentation and measurement; Intermodulation distortion; Propagation delay; Testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2006.1708350
  • Filename
    1708350
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=785654