• DocumentCode
    785735
  • Title

    Simple Expression of Field Nonuniformity Factor for Hemispherically Capped Rod-Plane Gaps

  • Author

    Qiu, Y.

  • Author_Institution
    Xi´´an Jiaotong University China
  • Issue
    4
  • fYear
    1986
  • Firstpage
    673
  • Lastpage
    675
  • Abstract
    This communication compiles published computed data of the field nonuniformity factor for hemispherically capped rod-plane gaps, and presents two simple expressions for gaps with the ratio of gap length to rod radius ranging from 1 to 500.
  • Keywords
    Computational modeling; Corona; Dielectric breakdown; Dielectrics and electrical insulation; Distributed computing; Electrodes; Finite element methods; Optimization methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1986.348977
  • Filename
    4157048
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=785735