DocumentCode :
786189
Title :
Energy dissipation in submicrometer thick single-crystal silicon cantilevers
Author :
Yang, Jinling ; Ono, Takahito ; Esashi, Masayoshi
Author_Institution :
Venture Bus. Lab., Tohoku Univ., Sendai, Japan
Volume :
11
Issue :
6
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
775
Lastpage :
783
Abstract :
Discusses four kinds of mechanical energy losses in ultrathin micro-cantilevers of 60 nm, 170 nm, and 500 nm in thickness: thermoelastic loss, air damping, support loss, and surface loss. For the cantilevers with thickness H<500 nm and length L>10 μm, thermoelastic loss is negligible. But it becomes significant when the beam thickness H>500 nm and the length L<10 μm. The cantilevers are very liable to air damping, hardly operated at pressure higher than 10-3 mbar. In a high vacuum (<10-3 mbar), air damping is negligible, the support and surface loss play an important role. The shorter the cantilevers, the larger the support energy loss. For the cantilevers with L/H<100, the quality factors (Q factors) are limited by the support loss. When the length L>30 μm, the Q factors of the cantilevers are proportional to their thickness, i.e., surface loss dominates the mechanical behavior. Annealing the cantilevers of 170 nm thickness at 1000°C for 30 s under an ultrahigh vacuum (UHV) condition results in an over one order-of-magnitude increase of the Q factor, up to about 2.5×105 for cantilevers of 30-90 μm in length.
Keywords :
Q-factor; damping; elemental semiconductors; losses; micromechanical devices; silicon; thermoelasticity; 1000 degC; 10-3 mbar; 170 nm; 30 to 90 micron; 500 nm; 60 nm; Q factor; Si; air damping; annealing; beam thickness; mechanical energy losses; quality factors; single-crystal cantilevers; support loss; surface loss; thermoelastic loss; ultrathin micro-cantilevers; Damping; Energy dissipation; Energy resolution; Force sensors; Laser beams; Mechanical energy; Q factor; Silicon; Structural beams; Thermoelasticity;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2002.805208
Filename :
1097798
Link To Document :
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