Title :
Subpixel edge location in binary images using dithering
Author :
Liu, Xiangdong ; Ehrich, Roger W.
Author_Institution :
Dept. of Comput. Sci., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
This paper concerns the problem of obtaining subpixel estimates of the locations of straight edges in binary digital images using dithering. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and implementation is discussed
Keywords :
edge detection; random noise; binary images; dithering; subpixel edge location; subpixel estimates; uniformly distributed independent random noise; Computer vision; Digital images; Image reconstruction; Image storage; Inspection; Intelligent sensors; Pattern analysis; Pattern recognition; Position measurement; Writing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
