• DocumentCode
    787282
  • Title

    A computational study of thin-body, double-gate, Schottky barrier MOSFETs

  • Author

    Guo, Jing ; Lundstrom, Mark S.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    49
  • Issue
    11
  • fYear
    2002
  • fDate
    11/1/2002 12:00:00 AM
  • Firstpage
    1897
  • Lastpage
    1902
  • Abstract
    Nanoscale Schottky barrier MOSFETs (SBFETs) are explored by solving the two-dimensional Poisson equation self-consistently with a quantum transport equation. The results show that for SBFETs; with positive, effective metal-semiconductor barrier heights, the on-current is limited by tunneling through a barrier at the source. If, however, a negative metal-semiconductor barrier height could be achieved, on-current of SBFETs would approach that of a ballistic MOSFET. The reason is that the gate voltage would then modulate a thermionic barrier rather than a tunneling barrier, a process similar to ballistic MOSFETs and one that delivers more current.
  • Keywords
    MOSFET; Poisson equation; Schottky barriers; nanoelectronics; semiconductor device models; nanoscale Schottky barrier MOSFETs; negative metal-semiconductor barrier height; on-current; positive metal-semiconductor barrier heights; quantum transport equation; self-consistent solution; thermionic barrier; thin-body double-gate Schottky barrier MOSFETs; tunneling; two-dimensional Poisson equation; Degradation; Fabrication; Immune system; MOSFETs; Nanoscale devices; Poisson equations; Schottky barriers; Silicides; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.804696
  • Filename
    1097905