DocumentCode
787282
Title
A computational study of thin-body, double-gate, Schottky barrier MOSFETs
Author
Guo, Jing ; Lundstrom, Mark S.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
49
Issue
11
fYear
2002
fDate
11/1/2002 12:00:00 AM
Firstpage
1897
Lastpage
1902
Abstract
Nanoscale Schottky barrier MOSFETs (SBFETs) are explored by solving the two-dimensional Poisson equation self-consistently with a quantum transport equation. The results show that for SBFETs; with positive, effective metal-semiconductor barrier heights, the on-current is limited by tunneling through a barrier at the source. If, however, a negative metal-semiconductor barrier height could be achieved, on-current of SBFETs would approach that of a ballistic MOSFET. The reason is that the gate voltage would then modulate a thermionic barrier rather than a tunneling barrier, a process similar to ballistic MOSFETs and one that delivers more current.
Keywords
MOSFET; Poisson equation; Schottky barriers; nanoelectronics; semiconductor device models; nanoscale Schottky barrier MOSFETs; negative metal-semiconductor barrier height; on-current; positive metal-semiconductor barrier heights; quantum transport equation; self-consistent solution; thermionic barrier; thin-body double-gate Schottky barrier MOSFETs; tunneling; two-dimensional Poisson equation; Degradation; Fabrication; Immune system; MOSFETs; Nanoscale devices; Poisson equations; Schottky barriers; Silicides; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2002.804696
Filename
1097905
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