• DocumentCode
    787493
  • Title

    High-power 4H-SiC JBS rectifiers

  • Author

    Singh, Ranbir ; Capell, D. Craig ; Hefner, Allen R. ; Lai, Jason ; Palmour, John W.

  • Author_Institution
    Cree Inc., Durham, NC, USA
  • Volume
    49
  • Issue
    11
  • fYear
    2002
  • fDate
    11/1/2002 12:00:00 AM
  • Firstpage
    2054
  • Lastpage
    2063
  • Abstract
    This paper reports the detailed design, fabrication, and characterization of two sets of high-power 4H-silicon carbide (4H-SiC) junction barrier Schottky (JBS) diodes - one with a 1500-V, 4-A capability and another with 1410-V, 20-A capability. Two-dimensional (2-D) device simulations show that a grid spacing of 4 μm results in the most optimum trade-off between the on-state and off-state characteristics for these device ratings. JBS diodes with linear and honeycombed p+ grids, Schottky diodes and implanted p-i-n diodes fabricated alongside show that while 4H-SiC JBS diodes behave similar to,Schottky diodes in the on-state and switching characteristics, they show reverse characteristics similar to p-i-n diodes. Measurements on 4H-SiC JBS diodes indicate that the reverse-recovery time (τrr) and associated losses are near-zero even at a high reverse dI/dt of 75 A/μs. A dc/dc converter efficiency improvement of 3-6% was obtained over the fastest, lower blocking voltage silicon (Si) diode when operated in the 100-200 kHz range.
  • Keywords
    Schottky diodes; power semiconductor diodes; semiconductor device models; silicon compounds; solid-state rectifiers; wide band gap semiconductors; 100 to 200 kHz; 1410 V; 1500 V; 20 A; 2D device simulations; 3 to 6 percent; 4 A; 4 micron; JBS rectifiers; SiC; blocking voltage; dc/dc converter efficiency; grid spacing; honeycombed p+ grids; junction barrier Schottky diodes; off-state characteristics; on-state characteristics; reverse characteristics; reverse-recovery time; DC-DC power converters; Fabrication; Loss measurement; P-i-n diodes; Rectifiers; Schottky diodes; Silicon; Time measurement; Two dimensional displays; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.804715
  • Filename
    1097925