• DocumentCode
    790044
  • Title

    Excitation of thick-film resonant sensor structures

  • Author

    White, N.M. ; Brignell, J.E.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    142
  • Issue
    3
  • fYear
    1995
  • fDate
    5/1/1995 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    248
  • Abstract
    Thick-film technology is attractive in sensor applications because of its cheapness and robustness. The main problem is the relative difficulty of controlling the dimensions and properties of the films without adding expensive trimming processes. Resonant sensors, on the other hand, have a number of advantages, including a relative insensitivity to variations in the added films. Combining the two technologies could therefore be advantageous. Two methods of exciting mechanical resonance in a simple cantilever beam are investigated. The first is based on periodic Joule heating in a conventional thick-film resistor and the second on piezoelectric deformation of a specially formulated ink. In each case, a strain sensor is added to provide for sustained oscillation by electronic positive feedback. Open-loop measurements show that in each case a Q factor of the order of 200 is achievable
  • Keywords
    electric sensing devices; piezoelectric transducers; strain sensors; thick film resistors; Q factor; cantilever beam; dimensions; electronic positive feedback; ink; low cost; mechanical resonance excitation; open-loop measurement; periodic Joule heating; piezoelectric deformation; robustness; strain sensor; sustained oscillation; thermally excited beam; thick-film resistor; thick-film resonant sensor structures; thick-film technology; trimming processes;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19951721
  • Filename
    388332