• DocumentCode
    790218
  • Title

    A Damaging Process on Mechanical Wear of Metallic Thin Film Media

  • Author

    Furuya, N. ; Karimoto, H. ; Nakayama, Y. ; Watanabe, W.

  • Author_Institution
    Matsushita Research Institute Tokyo, Inc.
  • Volume
    3
  • Issue
    4
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    298
  • Lastpage
    309
  • Abstract
    The authors studied processes by which metallic thin film (CoCr/NiFe) type flexible disks are damaged when run against a head. Scratches formed in disk surfaces when run against a head were examined, an ITV camera was used in dynamic observations of surface scratching, scratch tests using a diamond needle performed, and computer analysis were conducted to determine stresses and strains caused by a small foreign object lodged between head and medium. It was concluded that small (several ¿m), hard objects caught between head and medium may cause large stressing of the metallic thin film and consequent scratching; that strain in the scratched film may cause the medium to bend locally, increasing spacing losses of reproducing signals; and that greater stressing of the metallic film may cause cracking of the latter.
  • Keywords
    Cameras; Magnetic films; Magnetic heads; Magnetic recording; Needles; Perpendicular magnetic recording; Stress; Testing; Thin film devices; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1988.4563698
  • Filename
    4563698