DocumentCode
790218
Title
A Damaging Process on Mechanical Wear of Metallic Thin Film Media
Author
Furuya, N. ; Karimoto, H. ; Nakayama, Y. ; Watanabe, W.
Author_Institution
Matsushita Research Institute Tokyo, Inc.
Volume
3
Issue
4
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
298
Lastpage
309
Abstract
The authors studied processes by which metallic thin film (CoCr/NiFe) type flexible disks are damaged when run against a head. Scratches formed in disk surfaces when run against a head were examined, an ITV camera was used in dynamic observations of surface scratching, scratch tests using a diamond needle performed, and computer analysis were conducted to determine stresses and strains caused by a small foreign object lodged between head and medium. It was concluded that small (several ¿m), hard objects caught between head and medium may cause large stressing of the metallic thin film and consequent scratching; that strain in the scratched film may cause the medium to bend locally, increasing spacing losses of reproducing signals; and that greater stressing of the metallic film may cause cracking of the latter.
Keywords
Cameras; Magnetic films; Magnetic heads; Magnetic recording; Needles; Perpendicular magnetic recording; Stress; Testing; Thin film devices; Transistors;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1988.4563698
Filename
4563698
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