• DocumentCode
    790342
  • Title

    The IEEE Gel Task Force-an early look at the final testing

  • Author

    Balde, John W.

  • Author_Institution
    IDC Corp., Flemington, NJ, USA
  • Volume
    12
  • Issue
    4
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    426
  • Lastpage
    429
  • Abstract
    In 1986, the IEEE convened a Task Force to explore the chip protection afforded through the use of silicone gels. There have been three rounds of testing: two to determine the promise and expectations of the technology, and the third to qualify the test sites. The overall thrust of the Task Force was to determine whether a thin coating of silicone gel on the surface of the semiconductor chip would provide corrosion protection equal to or perhaps better than the protection afforded by a ceramic hermetically sealed package. Six types of coating were used: five gels and, for comparison, one cell of silicone rubber. The results are summarized
  • Keywords
    corrosion protective coatings; encapsulation; environmental testing; gels; integrated circuit technology; materials testing; packaging; reliability; silicones; IEEE Gel Task Force; IEEE Task Force reports; chip protection; corrosion protection; reliability testing; semiconductor chip; silicone gels; silicone rubber; thin coating of silicone gel; types of coating; Assembly; Coatings; Corrosion; Helium; Hermetic seals; Performance evaluation; Protection; Qualifications; Semiconductor device packaging; Testing;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.48999
  • Filename
    48999