DocumentCode
790613
Title
Reliability figures of merit for surface-soldered leadless chip carriers compared to lead packages
Author
Clech, Jean-Paul M. ; Engelmaier, Werner ; Kotlowitz, Robert W. ; Augis, Jacques A.
Author_Institution
AT&T Bell Lab., Whippany, NJ, USA
Volume
12
Issue
4
fYear
1989
fDate
12/1/1989 12:00:00 AM
Firstpage
449
Lastpage
458
Abstract
Solder attachment reliability figures of merit (FMs) have been developed that account for the primary factors determining long-term interconnection integrity. The FMs provide relative measures of the reliability impact of a component or device/substrate assembly and serve as a GO/NO-GO decision tool for package, physical, and circuit designers. The FMs are an integral part of the design-for-reliability process at key product development stages. These design phases include component design and/or selection, component/substrate assembly design, and system design, including thermal environment, product service life, and attachment reliability target. The use of FMs for attachment reliability evaluation is discussed through examples based on the solder-joint fatigue performance of thermally cycled leaded and leadless surface-mounted devices
Keywords
environmental testing; fatigue testing; integrated circuit technology; life testing; packaging; printed circuit manufacture; reliability; soldering; surface mount technology; GO/NO-GO decision tool; attachment reliability evaluation; attachment reliability target; circuit design; design phases; design-for-reliability process; device/substrate assembly; lead packages; leadless surface-mounted devices; long-term interconnection integrity; package design; physical design; primary factors; product development stages; product service life; reliability impact; solder attachment reliability figures of merit; solder-joint fatigue performance; surface-soldered leadless chip carriers; thermal cycling; thermal environment; Capacitive sensors; Fatigue; Lead; Magneto electrical resistivity imaging technique; Packaging; Samarium; Soldering; Temperature distribution; Thermal expansion; Thermal stresses;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.49001
Filename
49001
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