• DocumentCode
    790613
  • Title

    Reliability figures of merit for surface-soldered leadless chip carriers compared to lead packages

  • Author

    Clech, Jean-Paul M. ; Engelmaier, Werner ; Kotlowitz, Robert W. ; Augis, Jacques A.

  • Author_Institution
    AT&T Bell Lab., Whippany, NJ, USA
  • Volume
    12
  • Issue
    4
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    458
  • Abstract
    Solder attachment reliability figures of merit (FMs) have been developed that account for the primary factors determining long-term interconnection integrity. The FMs provide relative measures of the reliability impact of a component or device/substrate assembly and serve as a GO/NO-GO decision tool for package, physical, and circuit designers. The FMs are an integral part of the design-for-reliability process at key product development stages. These design phases include component design and/or selection, component/substrate assembly design, and system design, including thermal environment, product service life, and attachment reliability target. The use of FMs for attachment reliability evaluation is discussed through examples based on the solder-joint fatigue performance of thermally cycled leaded and leadless surface-mounted devices
  • Keywords
    environmental testing; fatigue testing; integrated circuit technology; life testing; packaging; printed circuit manufacture; reliability; soldering; surface mount technology; GO/NO-GO decision tool; attachment reliability evaluation; attachment reliability target; circuit design; design phases; design-for-reliability process; device/substrate assembly; lead packages; leadless surface-mounted devices; long-term interconnection integrity; package design; physical design; primary factors; product development stages; product service life; reliability impact; solder attachment reliability figures of merit; solder-joint fatigue performance; surface-soldered leadless chip carriers; thermal cycling; thermal environment; Capacitive sensors; Fatigue; Lead; Magneto electrical resistivity imaging technique; Packaging; Samarium; Soldering; Temperature distribution; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.49001
  • Filename
    49001