DocumentCode :
791225
Title :
Computation of bit-error probabilities for optical receivers using thin avalanche photodiodes
Author :
Choi, Byonghyok ; Hayat, Majeed M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
Volume :
10
Issue :
1
fYear :
2006
fDate :
1/1/2006 12:00:00 AM
Firstpage :
56
Lastpage :
58
Abstract :
The large-deviation-based asymptotic-analysis and importance-sampling methods for computing bit-error probabilities for avalanche-photodiode (APD) based optical receivers, developed by Letaief and Sadowsky [IEEE Trans. Inform. Theory, vol. 38, pp. 1162-1169, 1992], are extended to include the effect of dead space, which is significant in high-speed APDs with thin multiplication regions. It is shown that the receiver´s bit-error probability is reduced as the magnitude of dead space increases relative to the APD´s multiplication-region width. The calculated error probabilities and receiver sensitivities are also compared with those obtained from the Chernoff bound.
Keywords :
avalanche breakdown; avalanche photodiodes; error statistics; importance sampling; optical receivers; sensitivity analysis; Chernoff bound; asymptotic-analysis; avalanche photodiode; bit-error probability; high-speed APD; importance-sampling method; large deviation theory; optical receiver sensitivity; thin multiplication region; Avalanche photodiodes; Error analysis; Error probability; Fluctuations; Gaussian approximation; Impact ionization; Optical computing; Optical receivers; Space exploration; Statistics;
fLanguage :
English
Journal_Title :
Communications Letters, IEEE
Publisher :
ieee
ISSN :
1089-7798
Type :
jour
DOI :
10.1109/LCOMM.2006.1576569
Filename :
1576569
Link To Document :
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