• DocumentCode
    791244
  • Title

    Measurement of Magnetostriction of Thin Films by an Optical Displacement Meter

  • Author

    Hashimoto, S. ; Hayakawa, M. ; Aso, K. ; Kaneko, M.

  • Author_Institution
    Sony Research Center
  • Volume
    3
  • Issue
    7
  • fYear
    1988
  • fDate
    7/1/1988 12:00:00 AM
  • Firstpage
    577
  • Lastpage
    579
  • Keywords
    Capacitance measurement; Displacement measurement; Magnetic field measurement; Magnetic films; Magnetostriction; Optical films; Probes; Thickness measurement; Thin film devices; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1988.4563798
  • Filename
    4563798
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=791244