DocumentCode :
791244
Title :
Measurement of Magnetostriction of Thin Films by an Optical Displacement Meter
Author :
Hashimoto, S. ; Hayakawa, M. ; Aso, K. ; Kaneko, M.
Author_Institution :
Sony Research Center
Volume :
3
Issue :
7
fYear :
1988
fDate :
7/1/1988 12:00:00 AM
Firstpage :
577
Lastpage :
579
Keywords :
Capacitance measurement; Displacement measurement; Magnetic field measurement; Magnetic films; Magnetostriction; Optical films; Probes; Thickness measurement; Thin film devices; Transistors;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1988.4563798
Filename :
4563798
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=791244
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