• DocumentCode
    791333
  • Title

    Electrostatic discharge damage of MR heads

  • Author

    Tian, Hong ; Lee, Jerry J K

  • Author_Institution
    Conner Peripherals, San Jose, CA, USA
  • Volume
    31
  • Issue
    6
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2624
  • Lastpage
    2626
  • Abstract
    Two mechanisms of ESD damage of MR heads, electrothermal damage of MR sensors and dielectric breakdown of MR shields, were investigated. Experimental results of temperature rise within the MR sensors agree well with theoretical predictions
  • Keywords
    electric breakdown; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; temperature distribution; ESD damage; MR heads; MR sensors; MR shields; damage threshold; dielectric breakdown; electrostatic discharge; electrothermal damage; electrothermal failure; heat transfer model; magnetoresistive head; temperature rise; Electrostatic discharge; Electrothermal effects; Fault location; Heat transfer; Surface discharges; Surface treatment; Temperature sensors; Thermal conductivity; Thermal sensors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.490073
  • Filename
    490073
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=791333