Magnetic and recording characteristics of Cr, Ta, W and Zr pre-coated glass disks

Author

Kataoka, Wiroyuki ; Kanbe, T. ; Kashiwase, Hidekazu ; Fujita, Enji ; Yahisa, Yotsuo ; Furusawa, Kenji

Author_Institution

Production Eng. Res. Lab., Hitachi Ltd., Yokohama, Japan

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2734

Lastpage

2736

Abstract

Magnetic and recording characteristics of CoCrPt/CrTi media which are deposited on Cr, Ta, W and Zr pre-coated glass disks, are examined. High S* was obtained on Ta and Zr. The largest output signal and the lowest DC-erase and recording noise were obtained on Ta. The recording noise on Zr pre-coated disk was second lowest. When the pre-coating thickness is increased, H_c on Ta increased by 700 Oe but the H_c increase on Zr was small. On the other hand, the DC-erase noise stayed constant and the recording noise decreased on Ta and both DC-erase noise and recording noise slightly increased on Zr. The δM measurement revealed that the increase of Ta thickness caused the reduction of magnetic interaction between CoCrPt crystals. Strong Co(110)/Cr(100) orientation was observed on Ta and no major difference in crystal grain size was observed between Ta, Zr pre-coated media. The low DC-erase noise characteristics on Ta pre-coating would be attributed mainly to strong in-plane c-axis orientation

Keywords

chromium; chromium alloys; cobalt alloys; coercive force; crystal orientation; ferromagnetic materials; grain size; magnetic multilayers; magnetic recording noise; platinum alloys; tantalum; titanium alloys; tungsten; zirconium; CoCrPt-CrTi-Cr; CoCrPt-CrTi-Ta; CoCrPt-CrTi-W; CoCrPt-CrTi-Zr; DC-erase noise; crystal grain size; in-plane c-axis orientation; magnetic interaction; output signal; pre-coating thickness; recording characteristics; recording noise; Chromium; Disk recording; Glass; Grain size; Magnetic noise; Magnetic recording; Noise measurement; Noise reduction; Thickness measurement; Zirconium;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490107

Filename

490107