Title :
The Relationship Between Surface Profile and Durability of Co-Cr Perpendicular Magnetic Recording Medium
Author :
Isurugi, M. ; Nakamura, Y. ; Iwasaki, S.
Author_Institution :
Tohoku University.
Keywords :
Magnetic recording; Optical microscopy; Optical recording; Optical surface waves; Perpendicular magnetic recording; Rough surfaces; Shape measurement; Spectral analysis; Surface roughness; Writing;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1988.4563851
