Micromagnetics study for Ba-ferrite longitudinal thin-film media

The effect of grain stacks on media noise in Ba-ferrite longitudinal thin-film media is studied by micromagnetic model. Reverse dc erasure and recording processes were simulated for films with different grain stack characteristics. The effect of grain stacks on media noise is seen to depend on their orientations. Films with relatively few stacks were used as a reference, and when the number of stacks was increased, across-track stacks were seen to cause significant rises both in modulation noise and in transition noise at all bit intervals. Such rises were not observed, however, to accompany increases in the number of along-track stacks