• DocumentCode
    792174
  • Title

    Double-layer no-flow underfill materials and process

  • Author

    Zhang, Zhuqing ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    26
  • Issue
    2
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    199
  • Lastpage
    205
  • Abstract
    The no-flow underfill has been invented and practiced in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. Chip scale package (CSP) components are assembled using the double-layer no-flow underfill process. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. With a high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation.
  • Keywords
    chip scale packaging; design of experiments; encapsulation; filled polymers; flip-chip devices; reflow soldering; wetting; SiO2; assembly yield; bottom layer underfill thickness; bottom layer underfill viscosity; chip scale package; coefficient of thermal expansion; design of experiment; double-layer no-flow underfill material; flip-chip process; quartz chip; reflow profile; reliability; silica filler; solder joint formation; wetting properties; Chip scale packaging; Curing; Electromagnetic compatibility; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; Viscosity;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2003.817328
  • Filename
    1233580