Grain size effect on noise properties in CoCrTa thin film media

Author

Kojima, S. ; Fukaya, S. ; Yahisa, Y. ; Hosoe, Y. ; Kodama, N.

Author_Institution

Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2830

Lastpage

2832

Abstract

Grain growth of Cr and CoCrTa thin film was examined using high resolution transmission electron microscopy (HRTEM) and high resolution scanning microscopy (HRSEM). The effect of crystallography on media noise was studied. The grain size of the CoCrTa thin film increases with thickness and retains a bi-crystal structure over a range of Cr grain size. Media noise at a high recording density seems to increase with the grain size of Cr underlayer surface. This suggests that the micromagnetization process can be influenced by a bi-crystal structure of Co alloy films at their initial layers

Keywords

bicrystals; chromium alloys; cobalt alloys; ferromagnetic materials; grain growth; grain size; magnetic recording noise; magnetic thin films; scanning electron microscopy; tantalum alloys; transmission electron microscopy; CoCrTa thin film; CoCrTa-Cr; Cr underlayer; bicrystal structure; crystallography; grain growth; grain size; high resolution scanning electron microscopy; high resolution transmission electron microscopy; micromagnetization; noise; recording density; Chromium alloys; Cobalt alloys; Grain boundaries; Grain size; Lattices; Magnetic films; Magnetic noise; Surface morphology; Transistors; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490166

Filename

490166